%0 Journal Article %T Analysis of asymmetric broadening of X-ray diffraction peak profiles caused by randomly distributed polarized dislocation dipoles and dislocation walls %+ Matériaux et Mécanique des Composants (EDF R&D MMC) %A Groma, I. %A Monnet, G. %< avec comité de lecture %@ 0021-8898 %J Journal of Applied Crystallography %I International Union of Crystallography %V 35 %N 5 %P 589 - 593 %8 2002-10 %D 2002 %R 10.1107/S0021889802010695 %Z Physics [physics]/Mechanics [physics]/Mechanics of materials [physics.class-ph]Journal articles %G English %L hal-01830748 %U https://edf.hal.science/hal-01830748 %~ EDF